Normal view MARC view ISBD view

Line X Tester Analysis For Grain Yield and Some of its Components in Wheat (Triticum aestivum L.)

Singh, Rajesh

Line X Tester Analysis For Grain Yield and Some of its Components in Wheat (Triticum aestivum L.) - Indore J.N.K.V.V. 1996 - 68 pg.

Subjects--Topical Terms:
Plant Breeding and Genetics

Dewey Class. No.: 631.53 SIN-L

Place hold
Print
Add to your cart (remove)
Suggest for purchase
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)