000 00373nam a2200145Ia 4500
008 170101s1961 xx 000 0 und d
041 _aEnglish
082 _aGN621.38152 V89
100 _aWILLIAM H
245 0 _aSEMICONDUCTOR RELIABILITY
260 _aLONDON
_bCHAMPMAN & HALL
_c1961
300 _a400
_ePrint
653 _aSEMICONDUCTOR RELIABILITY
942 _2ddc
_cBK
999 _c222042
_d222042