Line X Tester Analysis For Grain Yield and Some of its Components in Wheat (Triticum aestivum L.)

By: Singh, RajeshContributor(s): Guide: Holkar, A.SMaterial type: TextTextPublication details: Indore J.N.K.V.V. 1996Description: 68 pgSubject(s): Plant Breeding and GeneticsDDC classification: 631.53 SIN-L Dissertation note: M.Sc.(Plant Breeding and Genetics)
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M.Sc.(Plant Breeding and Genetics)

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